CS-EE Seminar
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Title:  Marker-Finding and Automated Registration in AFM-Fluorescence Microscope Hybrid Imaging
Speaker: Serdar Çakıcı (SAP)
Date/Time: Oct 15, 2014 12:40 
Place: FENS G032
Abstract: To identify multi-protein complexes with high accuracy, Dr. Tessmer and her group from the University of Würzburg derived a system that uses fluorescence microscopy and atomic force microscopy (AFM) simultaneously on the same specimen. They overlaid images coming from the two different types of microscopes, and came up with a hybrid image that had more information about the specimen compared to the information gained from each microscope image alone. Localization of markers in AFM and fluorescence images and overlaying the images using the markers were all done manually in their work. In my work, I developed algorithms to automatically find the markers in both images and register images using the locations of the markers.
Biography: Serdar Çakıcı got his BSc and MSc in Computer Science - Bioinformatics & Computer Graphics from Sabancı University. He earned his second MSc in Computer Science - Scientific Visualization & Image Analysis from the University of North Carolina at Chapel Hill in the US. After working for an educational software company in the US, he recently relocated to İstanbul to work for SAP.
Contact: Hüsnü Yenigün